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KT-4DG

HK$0.00

Highly advanced ATE+BTT single step DRAM device tester

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Highly advanced ATE+BTT single step DRAM device tester

Highly advanced ATE+BTT single step DRAM device tester

Key Features

  • Btt up to 1.600Gbps, ATE up to 3Gbps

  • Hot Temperature Cycling by Handler

  • DDR4

  • Parallelism – 128 Duts, x8 Base

Specs

  • Available in configurations up to 128 devices in parallel

  • Full Btt support

  • True double data rate tests, No pattern generator interleaving, No special “Mux” modes required to achieve high data rates

  • Support Low Power and Wide I/O

  • Very small footprint

  • No special air, power, or cooling requirements

Standard device level contact, leakage, IDD, Btt, PPG and PMU testing

Full suite of test patterns provided

128 DUTs in parallel (x8), up to 256 with dual chassis option

Higher performance and more capabilities

Active HiFix (driving electronics inside HiFix)

  • Device type change via socket board

  • System upgrade via HiFix change

DDR4 support

Supports Low Power and Wide I/O

Adjustable clocks

  • tRC, tRCD, tRASmin, tRASmax, tRP, tRRD, tWTR, tRTW, tRFC, tAL, tCWL, tRTP

Address Generation

  • 16 Rows + 15 Columns + 4 Bank Selects

Automated DDR4 read/write leveling

Features Standard in All KTI Products:

  • Failure/Design Analysis Tools including Shmoo and Burn-in

  • Simple drag and drop test flow creation

  • Full test flow control including looping, binning, etc.

  • Fully programmable pattern generator – we provide you many industry standard patterns, but you can write your own too!

  • Enhanced SPD programming tool including Address Tests, Write Protect tests and activation, date/time/serial number stamps, DDR4 Temperature testing, etc.

  • Enhanced software customization available – data logging and analysis, tester flow control, bar code scanning, etc.

Programmable Pattern Generator (PPG)

  • For custom test patterns

  • Ease of use

  • Many standard patterns included

Many standard test patterns available.

  • March, X, Y, G, LR, LRD, IFA 13 and many more

  • IDD tests – all including IDD6

Simple setup: One standard PC (provided), USB cable from PC to tester, and simple PC power cable to power the tester.

Easy to use, modern, Windows User Interface.

Programmable Pattern Generator (PPG)

Specialized CPU for memory testing.

  • Custom test programs are written

  • Converted to binary programs

  • Downloaded to the tester for execution

PPG fully integrated into Tiger Claw.

  • GUI front end

  • High-speed assembler

  • Color coded source editor

  • Write the patterns your customers require!